Patil, Jayashri Jagannath, and Nilesh Ashok Suryawanshi. “Deep Feature Extraction Techniques For Machine Learning-Based Digital Image Steganalysis”. International Journal of Artificial Intelligence and Machine Learning 6, no. 7s (July 19, 2026): 1102–1120. Accessed August 24, 2026. https://svedbergopen.com/index.php/ijaiml/article/view/1170.