WANKHEDE, Shrunkhala Satish; JAIN, Khushboo; PIKLE, Nileshchandra. Enhanced Fault Detection in Power Electronics-Dominated Microgrids: A Machine Learning Framework with Residual-Based Features and Class Imbalance Mitigation. International Journal of Artificial Intelligence and Machine Learning, [S. l.], v. 6, n. 13s, p. 1146–1162, 2026. DOI: 10.51483/IJAIML.2818. Disponível em: https://svedbergopen.com/index.php/ijaiml/article/view/2818. Acesso em: 27 oct. 2026.