THIRUNAVUKKARASU, Mrs. Arulnancy; SELVI, Dr.M.Phemina; SIVARAMAN, Jegan. Artificial Intelligence for VLSI Reliability: A Comprehensive Review of Machine Learning, Deep Learning, and Explainable AI for Fault Prediction and Diagnosis. International Journal of Artificial Intelligence and Machine Learning, [S. l.], v. 6, n. 11s, p. 1617–1628, 2026. DOI: 10.51483/IJAIML.6.11s.2026.1617-1628. Disponível em: https://svedbergopen.com/index.php/ijaiml/article/view/2320. Acesso em: 6 oct. 2026.